The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Dec. 24, 2019
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventor:

Chien-Wen Chen, Hsinchu County, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01J 9/02 (2006.01); G02B 27/14 (2006.01); G02B 27/42 (2006.01);
U.S. Cl.
CPC ...
G01J 9/02 (2013.01); G02B 27/144 (2013.01); G02B 27/4233 (2013.01);
Abstract

A measuring device including a light source emitting a light beam, a first beam splitter disposed on a light path of the light beam, an optical grating, a reflector, and a sensor is provided. The light beam is divided into first and second light beams by the first beam splitter. The optical grating is disposed on light paths of the first and second light beams. The first beam splitter enables the first light beam to be delivered to the optical grating. The reflector is disposed on the light path of the second light beam. The first beam splitter enables the second light beam to be delivered to the reflector and reflected to the optical grating. The first and second light beams are diffracted by the optical grating to generate multiple first and second diffraction light beams at different angles respectively, which are received by the sensor after interference.


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Chen, Chien-Wen. (2021). Measuring device (U.S. Patent No. 10962418). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10962418

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