The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Jan. 14, 2019
Tsinghua University, Beijing, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Jun Zhu, Beijing, CN;
Ben-qi Zhang, Beijing, CN;
Guo-Fan Jin, Beijing, CN;
Shou-Shan Fan, Beijing, CN;
Tsinghua University, Beijing, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A freeform surface imaging spectrometer system including a primary mirror, a secondary mirror, a tertiary mirror, and a detector is provided. The secondary mirror is a grating having a freeform surface shape, and the grating having the freeform surface shape is obtained by intersecting a set of equally spaced parallel planes with a freeform surface. A plurality of feature rays exiting from a light source is successively reflected by the primary mirror, the secondary mirror and the tertiary mirror to form an image on an image sensor. A reflective surface of each of the primary mirror, the tertiary mirror surface and the tertiary mirror is an xy polynomial freeform surface.