The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Sep. 07, 2018
Applicant:

Kaarta, Inc., Pittsburgh, PA (US);

Inventors:

Ji Zhang, Pittsburgh, PA (US);

Sanjiv Singh, Pittsburgh, PA (US);

Assignee:

Kaarta, Inc., Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/16 (2006.01); G01C 21/32 (2006.01); G01S 17/89 (2020.01); G01S 7/48 (2006.01); G01S 17/86 (2020.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G01C 21/165 (2013.01); G01C 21/32 (2013.01); G01S 7/4808 (2013.01); G01S 17/86 (2020.01); G01S 17/89 (2013.01); G01S 17/931 (2020.01);
Abstract

A mapping system, comprising an inertial measurement unit; a camera unit; a laser scanning unit; and a computing system in communication with the inertial measurement unit, the camera unit, and the laser scanning unit, wherein the computing system computes first measurement predictions based on inertial measurement data from the inertial measurement unit at a first frequency, second measurement predictions based on the first measurement predictions and visual measurement data from the camera unit at a second frequency and third measurement predictions based on the second measurement predictions and laser ranging data from the laser scanning unit at a third frequency.


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