The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Mar. 17, 2015
Applicant:

3m Innovative Properties Company, St. Paul, MN (US);

Inventors:

Kaoru Otsuka, Tokyo, JP;

Norihisa Watanabe, Kanagawa, JP;

Hitoshi Morimoto, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
G01B 11/165 (2013.01);
Abstract

Problem: To provide a sheet and a structural deformation-evaluating article comprising the same that allow for convenient and quantitative three-dimensional inspection of the deformation of an object. Resolution means: A sheet comprising a deformation-conforming section comprising a first pattern image, a deformation-non-conforming section comprising a second pattern image, and a deformation-mitigating section present between the deformation-conforming section and the deformation-non-conforming section, the first pattern image being visible through the second pattern image; and a structural deformation-evaluating article comprising the sheet are provided.


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