The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10962166 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 30, 2021

Filed:

Aug. 02, 2018
Applicant:

United States of America As Represented BY the Administator of Nasa, Washington, DC (US);

Inventor:

Yong Liu, San Marino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); F16M 11/12 (2006.01); G06N 3/04 (2006.01); G05B 15/02 (2006.01); G05D 3/20 (2006.01); F16M 13/02 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
F16M 11/121 (2013.01); G05B 15/02 (2013.01); G05D 3/20 (2013.01); G06N 3/04 (2013.01); F16M 13/02 (2013.01); G06N 20/00 (2019.01);
Abstract

Calibration of a hexapod structure includes measuring a head pose of the hexapod structure relative to a base of the hexapod structure. Calibration of the hexapod structure also includes for each strut, independently increasing a length of each strut by a predefined amount from an original length and repeating the measuring of the head pose relative to the base. Calibration of the hexapod structure further includes for each strut, independently decreasing a length of each strut by a predefined amount from the original length and repeating the measuring of the head pose relative to the base. Additionally, calibration of the hexapod structure includes moving each strut back to the original length, and estimating joint errors for each strut prior to calibrating of the hexapod structure.


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Liu, Yong. (2021). Hexapod pose knowledge improvement by joint location calibration with individual strut length differential measurements (U.S. Patent No. 10962166). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10962166

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