The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Feb. 02, 2017
Applicant:
Fedrigoni S.p.a., Verona, IT;
Inventors:
Eligio Ballabio, Pietrasanta, IT;
Pasquale Pallotta, Fabriano, IT;
Assignee:
FEDRIGONI S.P.A., Verona, IT;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B42D 25/373 (2014.01); B42D 25/328 (2014.01); B42D 25/369 (2014.01); B42D 25/378 (2014.01); B42D 25/445 (2014.01); G06K 19/06 (2006.01); B42D 25/23 (2014.01); B42D 25/24 (2014.01); B42D 25/29 (2014.01);
U.S. Cl.
CPC ...
B42D 25/373 (2014.10); B42D 25/328 (2014.10); B42D 25/369 (2014.10); B42D 25/378 (2014.10); B42D 25/445 (2014.10); G06K 19/06187 (2013.01); B42D 25/23 (2014.10); B42D 25/24 (2014.10); B42D 25/29 (2014.10);
Abstract
A security element includes a transparent film, a first layer and a second layer. The first layer includes a first metal arranged on the transparent film in a first pattern. The second layer includes a second metal being a baser metal than the first metal arranged over the first layer in a second pattern. Each of the first and second patterns is composed of metallic regions and metal-free regions. The metal-free regions of the second pattern overlap with the metal-free regions of the first pattern. The metallic regions of the first pattern overlap with the metal-free regions of the second pattern.