The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2021

Filed:

Aug. 15, 2016
Applicant:

Eth Zurich, Zurich, CH;

Inventors:

Victoria De Lange, Dubendorf, CH;

Janos Vörös, Zurich, CH;

Marco Habegger, Barau, CH;

Marco Schmidt, Brig, CH;

Assignee:

ETH ZURICH, Zurich, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
B01L 3/50255 (2013.01); B01L 3/5027 (2013.01); B01L 3/502715 (2013.01); B01L 2200/021 (2013.01); B01L 2200/0631 (2013.01); B01L 2200/0689 (2013.01); B01L 2200/12 (2013.01); B01L 2300/0645 (2013.01); B01L 2300/0654 (2013.01); B01L 2300/0681 (2013.01); B01L 2300/087 (2013.01); B01L 2300/0819 (2013.01); B01L 2300/0861 (2013.01); B01L 2400/0406 (2013.01); B01L 2400/0409 (2013.01); B01L 2400/0487 (2013.01);
Abstract

The invention relates to a device (), a method, and a kit for analysing liquid samples. The device () comprises a sample layer () having a plurality of liquid permeable test sites () separated by a liquid impermeable barrier region (), and an inlet part () comprising a plurality of inlet channels (), which lead to respective test sites () of the sample layer (), such that a flow connection between said inlet channels () and said respective test sites () is established or can be established, wherein said inlet channels () comprise first openings () and second openings (), wherein a second surface area defined by the positions of said second openings () is smaller than a first surface area defined by the positions of said first openings () The invention further relates to a method for functionalizing a sample layer ().


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