The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Jun. 01, 2016
Duke University, Durham, NC (US);
Peter J. Hollender, Durham, NC (US);
Gregg E. Trahey, Durham, NC (US);
Duke University, Durham, NC (US);
Abstract
Methods, systems and computer program products for determining a mechanical parameter for a sample having a target region using shear wave displacement are provided. The method includes a) generating at least one shear wave with an excitation pulse in the target region at an excitation position; b) transmitting tracking pulses in a tracking region, at least a portion of which is outside the target region; c) receiving corresponding echo signals for the tracking pulses in the tracking region; d) repeating steps A through C for one or more additional excitation positions within the target region, wherein at least two of the excitation pulses overlap and the tracking region associated with each excitation position overlaps with the tracking region associated with at least one other excitation position; and e) determining at least one mechanical parameter of the target region based on at least one parameter of a shear wave displacement.