The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2021
Filed:
Sep. 27, 2018
Topcon Corporation, Tokyo, JP;
Masashi Nakajima, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
To provide an ophthalmologic device and a pupil state measuring method capable of securing accuracy of a measurement result of objective measurement and effective for investigating the cause of an error during objective measurement. A pupil state measuring method according to the present invention includes: an ocular characteristic measuring step of objectively measuring an ocular characteristic of a subject eye of a subject; an imaging step of substantially simultaneously imaging an anterior ocular segment of the subject eye from different directions using at least two imaging units in measuring the ocular characteristic; a measuring step of analyzing at least one image of images taken by the at least two imaging units to measure a pupil state of the subject eye; and a step of performing the imaging step and the measuring step in measuring the ocular characteristic.