The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Jul. 12, 2016
Applicant:

Keysight Technologies Singapore (Sales) Pte. Ltd., Singapore, SG;

Inventor:

Thomas Ameling, Woodland Hills, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/177 (2006.01); H04L 29/12 (2006.01); H04L 12/46 (2006.01); H04L 12/66 (2006.01); H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 61/103 (2013.01); H04L 12/4641 (2013.01); H04L 12/4679 (2013.01); H04L 12/66 (2013.01); H04L 43/50 (2013.01); H04L 41/0866 (2013.01);
Abstract

Methods, systems, and computer readable media for network test configuration using VLAN scanning are disclosed. One method for network test configuration using VLAN scanning occurs at a first port of a network equipment test device. The method includes sending a plurality of address resolution protocol (ARP) requests to a system under test (SUT), wherein each of the plurality of ARP requests includes a different virtual local area network (VLAN) identifier (ID). The method also includes receiving an ARP response from the SUT, wherein the ARP response indicates a first VLAN ID associated with the SUT. The method further includes using the first VLAN ID when sending test packets to the SUT via the first port.


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