The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Jun. 02, 2017
Applicant:

U.s. Army Research Laboratory Attn: Rdrl-loc-i, Adelphi, MD (US);

Inventor:

Kwong-Kit Choi, Brookeville, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/0232 (2014.01); G06F 17/50 (2006.01); H01L 31/0352 (2006.01); H01L 27/144 (2006.01); H01L 31/0296 (2006.01); H01L 27/146 (2006.01); H01L 31/0224 (2006.01); H01L 31/054 (2014.01); H01L 31/056 (2014.01); H01L 31/101 (2006.01); G06F 30/30 (2020.01); B82Y 20/00 (2011.01);
U.S. Cl.
CPC ...
H01L 31/02327 (2013.01); G06F 30/30 (2020.01); H01L 27/1446 (2013.01); H01L 27/14601 (2013.01); H01L 27/14603 (2013.01); H01L 27/14683 (2013.01); H01L 31/02966 (2013.01); H01L 31/022408 (2013.01); H01L 31/022425 (2013.01); H01L 31/035236 (2013.01); H01L 31/035281 (2013.01); H01L 31/054 (2014.12); H01L 31/056 (2014.12); H01L 31/1013 (2013.01); B82Y 20/00 (2013.01); Y02E 10/52 (2013.01);
Abstract

A photodetector comprising a contact layer; an absorbing region positioned such that light admitted passes into the absorbing region; a diffractive region comprising at least one diffractive element operating to diffract light into the absorbing region; the configuration of the photodetector being determined by computer simulation to determine an optimal diffractive region and absorbing region configuration for optimal quantum efficiency for at least one predetermined wavelength range, the diffractive region operating to diffract light entering through the contact layer such that phases of diffracted waves from locations within the photodetector including waves reflected by sidewalls and waves reflected by the diffractive elements form a constructive interference pattern inside the absorbing region. A method of designing a photodetector comprises using a computer simulation to determine an optimal configuration for at least one wavelength range occurring when waves reflected by the diffractive element form a constructive interference pattern inside the absorbing region.


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