The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Dec. 04, 2018
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

Yury Y. Uralsky, Santa Clara, CA (US);

Jonah M. Alben, San Jose, CA (US);

Ankan Banerjee, Pune, IN;

Gregory Massal, Pflugerville, TX (US);

Thomas Petersen, San Jose, CA (US);

Oleg Kuznetsov, Santa Clara, CA (US);

Eric B. Lum, San Jose, CA (US);

Prakshep Mehta, Pune, IN;

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G06T 11/40 (2006.01);
U.S. Cl.
CPC ...
G06T 11/001 (2013.01); G06T 11/40 (2013.01); G06T 2200/12 (2013.01);
Abstract

A raster unit is configured to generate different sample patterns for adjacent pixels within a given frame. In addition, the raster unit may adjust the sample patterns between frames. The raster unit includes an index unit that selects a sample pattern table for use with a current frame. For a given pixel, the index unit extracts a sample pattern from the selected sample pattern table. The extracted sample pattern is used to generate coverage information for the pixel. The coverage information for all pixels is then used to generate an image. The resultant image may then be filtered to reduce or remove artifacts induced by the changing of sample locations.


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