The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Feb. 21, 2018
Cognex Corporation, Natick, MA (US);
Andrew Hoelscher, Somerville, MA (US);
Simon Barker, Sudbury, MA (US);
Adam Wagman, Stow, MA (US);
David J. Michael, Wayland, MA (US);
Cognex Corporation, Natick, MA (US);
Abstract
This invention applies dynamic weighting between a point-to-plane and point-to-edge metric on a per-edge basis in an acquired image using a vision system. This allows an applied ICP technique to be significantly more robust to a variety of object geometries and/or occlusions. A system and method herein provides an energy function that is minimized to generate candidate 3D poses for use in alignment of runtime 3D image data of an object with model 3D image data. Since normals are much more accurate than edges, the use of normal is desirable when possible. However, in some use cases, such as a plane, edges provide information in relative directions the normals do not. Hence the system and method defines a 'normal information matrix', which represents the directions in which sufficient information is present. Performing (e.g.) a principal component analysis (PCA) on this matrix provides a basis for the available information.