The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

May. 17, 2017
Applicant:

Safran, Paris, FR;

Inventor:

Yann Le Guilloux, Moissy-Cramayel, FR;

Assignee:

SAFRAN, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/557 (2017.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
G06T 7/557 (2017.01); G06T 7/593 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/10052 (2013.01);
Abstract

A method for three-dimensional reconstruction of a surface of interest using a plenoptic camera includes: determining the three-dimensional coordinates of a series of sampling points of the object field of the camera; determining calibration data, associating at least two pixels of the optical sensor matrix with each sampling point; defining a reconstruction grid having each point associated with at least one sampling point; acquiring an image of the surface of interest using the camera; from the calibration data and the image, calculating, for each point of the reconstruction grid, the dissimilarity index value as a function of one or more dispersions, each representing a distancing between the intensity values taken, on the image, by the pixels associated with one of the corresponding sampling points; determining a three-dimensional distribution of the points of the reconstruction grid, each assigned with its dissimilarity index value; and three-dimensional reconstruction of the surface of interest.


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