The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Aug. 30, 2019
Raytheon Company, Waltham, MA (US);
Grant B. Boroughs, Southlake, TX (US);
Stephen J. Raif, Sachse, TX (US);
Jody D. Verret, Rockwall, TX (US);
Raytheon Company, Waltham, MA (US);
Abstract
An image processing technique uses requirements for a geospatial distribution of image tie points for a triangulation of images. The images are correlated, thereby generating candidate tie points across the images. Statistical consistency checks are applied to the images to identify and dispose of the candidate tie points that are local outliers, and a geometric identification technique is applied to the images to identify and dispose of the candidate tie points that are global outliers. The candidate tie points that are not local outliers or global outliers are spatially down-selected such that the spatially down-selected candidate tie points satisfy the one or more requirements for the geospatial distribution.