The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Jul. 12, 2018
Adobe Inc., San Jose, CA (US);
Yuan Yuan, San Jose, CA (US);
Zhenyu Yan, Cupertino, CA (US);
Yiwen Sun, Santa Clara, CA (US);
Xiaojing Dong, Sunnyvale, CA (US);
Chen Dong, San Jose, CA (US);
Abhishek Pani, San Francisco, CA (US);
Adobe Inc., San Jose, CA (US);
Abstract
Dynamic Hierarchical Empirical Bayes techniques and systems are described that are implemented to control output of digital content. In one example, a system identifies splitting variables included in data. An amount of loss is then determined for each of the identified splitting variables by the system using a loss function. Based on the determined amounts of loss, the system selects at least one splitting variable from the plurality of splitting variables that are to be used to partition data in a respective node, e.g., a parent node to form a plurality of child nodes. The system, for instance, may select the splitting variable that minimizes the cost, i.e., has the lowest amount of cost. The selected splitting variable is then employed by the system to generate at least one hierarchical level of the hierarchical structure of the statistical model by partitioning data from the parent node into respective child nodes.