The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Nov. 29, 2016
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Charu C. Aggarwal, Yorktown Heights, NY (US);
Lingtao Cao, Hayward, CA (US);
Tan Hung M. Ng, San Jose, CA (US);
Saket Sathe, Mohegan Lake, NY (US);
Deepak S. Turaga, Elmsford, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G16H 10/60 (2018.01); G06N 5/02 (2006.01); G16H 50/70 (2018.01); G16H 40/63 (2018.01); G16H 40/67 (2018.01); G16H 50/20 (2018.01); G16H 50/50 (2018.01);
U.S. Cl.
CPC ...
G06N 5/02 (2013.01); G06N 20/00 (2019.01); G16H 10/60 (2018.01); G16H 40/63 (2018.01); G16H 40/67 (2018.01); G16H 50/20 (2018.01); G16H 50/50 (2018.01); G16H 50/70 (2018.01);
Abstract
Embodiments for accurate temporal event predictive modeling by a processor. An average reverse event delay may be determined from one or more event delays in a time-series window. A time-series event may be predicted by applying the average reverse event delay in conjunction with one or more weighted factors in a predictive model.