The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Oct. 12, 2017
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Tae S. Kim, Dallas, TX (US);

Gregory B. Shinn, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/398 (2020.01); H01L 27/02 (2006.01); G06F 17/18 (2006.01); G06F 119/18 (2020.01);
U.S. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 17/18 (2013.01); H01L 27/0207 (2013.01); G06F 2119/18 (2020.01);
Abstract

In some embodiments, a method includes selecting, a first circuit layout, where the first circuit layout includes a circuit element representation, a design rule, and a target circuit element value. The method further includes receiving a plurality of circuit element values of circuit elements fabricated in each of multiple fabrication facilities using the design rule. The method also includes selecting a fabrication facility and a circuit element value of circuit elements fabricated in the selected fabrication facility using the design rule. Further the method includes determining a circuit element value calculation based on the selected circuit element values, and determining an adjustment value. This adjustment value is further used to customize the design rule. The method then includes generating a second circuit layout comprising the customized design rule, causing the fabrication facility to fabricate a circuit using the second circuit layout.


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