The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Oct. 18, 2018
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Hitesh Bhagchandani, Bangalore, IN;

Arvind Maheswaran, Bangalore, IN;

Abhijit Kumar, Bangalore, IN;

Rajarajan Thangavel Ramalingam, Bangalore, IN;

Siddhartha Chakravarty, Kolkata, IN;

Neha Kagwad, Bangalore, IN;

Renuka R. Jogade, Bangalore, IN;

Mahadevaswamy Basavanna, Nanjangud, IN;

Sunny Balani, Gurgaon, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 17/18 (2006.01); G06N 20/00 (2019.01); G06F 111/10 (2020.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 17/18 (2013.01); G06N 20/00 (2019.01); G06F 2111/10 (2020.01);
Abstract

A machine learning (ML) based intermittent data processing system accesses a collection of intermittent data points, determines a data distribution associated with the collection and generates one or more calculated values based on the data distribution. A simulation can be employed to determine the accuracy of the calculated values based on which, the calculated values can be employed for further processing. The collection of intermittent data points is initially processed to determine if one or more of the data distribution identification, bootstrapping or variability capping techniques are to be applied in order to obtain the calculated values. The calculated values are used to generate visualizations and recommendations.


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