The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Aug. 30, 2018
International Business Machines Corporation, Armonk, NY (US);
Diptikalyan Saha, Bangalore, IN;
Aniya Aggarwal, New Delhi, IN;
Pranay Lohia, Bangalore, IN;
Kuntal Dey, New Delhi, IN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods, systems and computer program products for automated test case generation are provided herein. A computer-implemented method includes selecting sample input data as a test case for a system under test, executing the test case on the system under test to obtain a result, and applying the result to a local explainer function to obtain at least a portion of a corresponding decision tree. The method further includes determining at least one path constraint from the decision tree, solving the path constraint to obtain a solution, and generating at least one other test case for the system under test based at least in part on the solution of the path constraint. The steps of the method are illustratively repeated in each of one or more additional iterations until at least one designated stopping criterion is met. The resulting test cases form a test suite for testing of a deep neural network (DNN) or other system.