The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Oct. 09, 2015
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventor:
Shinji Nakagawa, Tokyo, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G05B 23/02 (2006.01); B21B 37/48 (2006.01); B21B 37/58 (2006.01); B21B 37/00 (2006.01); G01M 15/05 (2006.01); B21B 38/06 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); B21B 37/00 (2013.01); B21B 37/48 (2013.01); B21B 37/58 (2013.01); G01M 15/05 (2013.01); G05B 23/0235 (2013.01); G06F 11/0727 (2013.01); G06F 11/0754 (2013.01); B21B 38/06 (2013.01); B21B 2275/02 (2013.01); G05B 2219/36208 (2013.01);
Abstract
An object of the invention is to provide an abnormality detection device that can detect a processing abnormality of various types of software. The abnormality detection device according to the invention divides an output data series which is output by software into one or more clusters, determines that the output data included in any cluster is normal, and determines that the output data not included in any cluster is abnormal.