The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Apr. 13, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Tatsuya Horiguchi, Tokyo, JP;

Teppei Hirotsu, Tokyo, JP;

Hiroshi Iwasawa, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0221 (2013.01); G05B 19/042 (2013.01); G05B 2219/2637 (2013.01);
Abstract

Provided is a method of detecting and preventing soft errors without performing multiplexing. As a result, it is possible to improve reliability of a device while suppressing an increase in mounting cost and reduction in operation speed accompanied with it. A diagnosis system includes an initial parameter generation unit which generates a plurality of initial parameters predicted on the basis of an external input; an operation unit which has a plurality of operators operating optimal solutions to the initial parameters by using an evaluation function describing a control object; and a diagnosis unit which diagnoses the operation unit on the basis of an output of the operation unit. When an optimal solution candidate giving an evaluation value deviating from a value taken by each evaluation value by a constant threshold or more among evaluation values corresponding to the optimal solutions to the initial parameters is found, the diagnosis unit diagnoses an error of the operation unit.


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