The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Dec. 18, 2018
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Jeong-Hun Seo, Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G03F 1/84 (2012.01); G03F 1/36 (2012.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G03F 1/84 (2013.01); G03F 1/36 (2013.01); G06T 7/001 (2013.01); G06T 7/0006 (2013.01); G06T 7/97 (2017.01); G01N 21/956 (2013.01); G06T 2207/30148 (2013.01);
Abstract

A method for manufacturing a semiconductor device includes designing a layout, manufacturing a photomask based on the designed layout, and performing a photolithography process using the photomask to form a pattern on a substrate. The manufacturing of the photomask includes preparing the photomask including first and second chip regions, extracting first and second images from the first and second chip regions, respectively, averaging the first and second images to generate a preliminary standard image including a difference region between the first and second images, inserting a normal image into the difference region based on the layout to generate a standard image, and comparing each of the first and second images with the standard image to detect a defect of the first and/or second chip regions.


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