The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Mar. 10, 2016
Applicant:

Hoya Lens Thailand Ltd., Patumthani, TH;

Inventors:

Nobuyuki Tadokoro, Tokyo, JP;

Naoya Hirono, Tokyo, JP;

Masaaki Matsushima, Tokyo, JP;

Assignee:

HOYA LENS THAILAND LTD., Pathumthani, TH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02C 13/00 (2006.01); G01B 11/02 (2006.01); G02C 7/02 (2006.01); G01B 11/14 (2006.01); G06F 3/0484 (2013.01);
U.S. Cl.
CPC ...
G02C 13/005 (2013.01); G01B 11/02 (2013.01); G01B 11/14 (2013.01); G02C 7/02 (2013.01); G02C 13/00 (2013.01); G06F 3/04847 (2013.01);
Abstract

To perform measurement in which a load on a subject is reduced. To provide a spectacle wearing parameter measurement system including: an information processing unit configured to associate a size of an appearance of at least a part of actual spectacles with a size of an appearance of at least a part of each of the spectacles in an imaging result of imaging a subject wearing the actual spectacles as an imaging target, and obtain a spectacle wearing parameter from the imaging result and the related art of the system.


Find Patent Forward Citations

Loading…