The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Mar. 28, 2019
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Lars Stoppe, Jena, DE;
Thomas Ohrt, Golmsdorf, DE;
Christian Dietrich, Jena, DE;
Markus Sticker, Jena, DE;
Assignee:
Cad Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/24 (2006.01); G01N 21/88 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
G02B 21/245 (2013.01); G01N 21/8806 (2013.01); G02B 21/06 (2013.01); G02B 21/244 (2013.01); G02B 21/365 (2013.01); G01N 2201/061 (2013.01); G01N 2201/068 (2013.01);
Abstract
Various aspects of the invention relate to techniques to facilitate autofocus techniques for a test object by means of an angle-variable illumination. Here, image datasets are captured at a multiplicity of angle-variable illumination geometries. The captured image datsets are evaluated in order to determine the Z-position.