The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Feb. 08, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Gerald Bartley, Rochester, MN (US);

Matthew Doyle, Chatfield, MN (US);

Mark J. Jeanson, Rochester, MN (US);

Darryl Becker, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); H01L 27/30 (2006.01); H01L 51/00 (2006.01); H01G 9/20 (2006.01); H01L 51/42 (2006.01);
U.S. Cl.
CPC ...
G01T 1/24 (2013.01); H01G 9/2009 (2013.01); H01L 27/308 (2013.01); H01L 51/0077 (2013.01); H01L 51/4253 (2013.01);
Abstract

Disclosed is a device for detecting non-intrusive inspections. The device includes an electrical component with a first end cap and a second end cap. Additionally, the device includes an x-ray sensitive material electrically coupling the first end cap and the second end cap. The x-ray sensitive material has a first state having a first conductivity and a second state having a second conductivity. The sensing material is configured to transform from the first state to the second state when exposed to an initiating voltage.


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