The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Jun. 14, 2018
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Sherif Sayed Ahmed, Starnberg, DE;
Frank Gumbmann, Nuremberg, DE;
Tobias Koeppel, Munich, DE;
Michael Freissl, Munich, DE;
Christian Evers, Heimstetten, DE;
Thomas Fischer, Puchheim, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup comprises a positioning system, a reference reflector having a collection of diffuse scattering members, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.