The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Jun. 18, 2019
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Dan Trock, Katzrin, IL;

Valentin Bader, Tel Aviv, IL;

Shlomi Vilozny, Zoran, IL;

Shimon Rahamim, Oranit, IL;

Danny Sapoznikov, Misgav Dov, IL;

Yair Armoza, Beit Dagan, IL;

Itai Avron, Petah Tikva, IL;

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31704 (2013.01); G01R 31/31721 (2013.01);
Abstract

An integrated circuit includes first and second cores. Each core has a power-switchable portion in a first power domain in which an operating power is turned on or off in response to a power control signal. The first power domain includes a first scan chain, and the first power domain also includes a plurality of outputs. Each core also includes an always-on portion in a second power domain in which the operating power is maintained during testing of the integrated circuit. The second power domain also has a second scan chain. The second power domain further includes respective isolation gates coupled to the plurality of outputs of the first power domain, and the second scan chain includes a respective wrapper cell coupled to some isolation gates. The integrated circuit is configured to power off and isolate the power-switchable portion in the first power domain based on a scan test result.


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