The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Sep. 24, 2018
Applicant:

Siemens Aktiengesellschaft, München, DE;

Inventors:

Silvio Becher, Munich, DE;

Felix Buggenthin, Munich, DE;

Klaus Böhme, Berlin, DE;

Florian Büttner, Munich, DE;

Matthias Kereit, Berlin, DE;

Igor Kogan, Berlin, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/08 (2020.01); G06N 3/08 (2006.01); G06N 3/04 (2006.01); G06N 20/00 (2019.01); G01R 11/25 (2006.01); G06N 20/20 (2019.01); H02H 1/00 (2006.01); G06N 5/00 (2006.01); G06N 20/10 (2019.01);
U.S. Cl.
CPC ...
G01R 31/086 (2013.01); G01R 11/25 (2013.01); G01R 31/085 (2013.01); G01R 31/088 (2013.01); G06N 3/0445 (2013.01); G06N 3/0454 (2013.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01); G06N 5/003 (2013.01); G06N 20/10 (2019.01); G06N 20/20 (2019.01); H02H 1/0092 (2013.01);
Abstract

Provided is an in-field apparatus and method for automatic localization of a fault having occurred at power transmission lines of a power supply system, the in-field apparatus includes a preprocessing unit configured to process measured voltage and/or current raw time series data of the power transmission lines to provide a normalized raw data and/or feature representation of the measured raw time series data, and an artificial intelligence module configured to predict an optimal evaluation time used for evaluation of the measured voltage and/or current raw time series data to localize the fault based on the normalized raw data and/or feature representation.


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