The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Feb. 09, 2017
Applicant:

Dialog Semiconductor B.v., 's-Hertogenbosch, NL;

Inventors:

Wessel Lubberhuizen, Delden, NL;

Ashley Hughes, Ediburgh, GB;

Assignee:

Dialog Semiconductor B.V., 's-Hertogenbosch, NL;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 21/00 (2006.01); G01R 33/00 (2006.01); G01R 35/00 (2006.01); G01C 17/38 (2006.01);
U.S. Cl.
CPC ...
G01P 21/00 (2013.01); G01R 33/0035 (2013.01); G01R 35/005 (2013.01); G01C 17/38 (2013.01);
Abstract

A method of data calibration, and in particular sensor calibration, which involves gathering an initial first estimate and then binning the data samples, so that calibration can be performed without the need for a known reference stimulus. The present disclosure relates to calibration of vectors in a measurement system, and in particular to calibration of a correction function for systematic errors in successive data vectors. There is provided a method of determining a vector calibration function comprising: binning successive data vectors; and optimising the binned data vectors once data vectors allocated to a minimum number of unique bins have been observed. The method comprises establishing an initial calibration estimate and where the binning and optimising are performed based on said initial calibration estimate.


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