The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Apr. 13, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hiroki Mizuno, Tokyo, JP;

Hisashi Nagano, Tokyo, JP;

Takahiro Itou, Tokyo, JP;

Makoto Namai, Tokyo, JP;

Fumihiko Nemoto, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/22 (2006.01); G01N 27/62 (2021.01); H01J 49/42 (2006.01); H01J 49/26 (2006.01);
U.S. Cl.
CPC ...
G01N 33/227 (2013.01); G01N 27/62 (2013.01); H01J 49/422 (2013.01); H01J 49/4225 (2013.01); H01J 49/26 (2013.01);
Abstract

In order to suppress malfunctions even when using a reagent (chemical for reagent) corresponding to a hazardous substance, the present invention has an analyzing unit in which a chemical for reagent, having added thereto an indicator that is different from a hazardous material that is a detection target, is used to calibrate on the basis of the detection target included in the chemical for reagent, and which performs mass spectrometry. When a peak corresponding to the indicator is not included and a peak corresponding to the detection target material is included in the spectrum that is the analysis result of the analyzing unit, the detection target is determined to be included.


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