The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Sep. 06, 2019
Applicant:

Beijing University of Technology, Beijing, CN;

Inventors:

Lifeng Fan, Beijing, CN;

Lijuan Wang, Beijing, CN;

Chao Xu, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/07 (2006.01); G01N 29/04 (2006.01); G01N 29/22 (2006.01);
U.S. Cl.
CPC ...
G01N 29/07 (2013.01); G01N 29/045 (2013.01); G01N 29/228 (2013.01); G01N 2291/0232 (2013.01); G01N 2291/0421 (2013.01);
Abstract

An experimental device for studying the propagation characteristics of stress wave in jointed rock mass at high temperatures. The device includes a launch system, a loading system, a measuring system and a heating device. The heating device can be heated in sections to meet complicated test requirements. The measuring system includes two sets of measuring devices to ensure test accuracy. One measuring device uses a strain gauge to measure the local displacement of rock, thus obtaining the change of wave velocity; this method can be used when sample temperature is low. The other device adopts digital image processing technology. The experimental device can control the initial wave form and initial wave velocity, which can better meet the test requirements. The position of the sample can be fine-tuned to avoid the impact of errors left by rock processing on the test results.


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