The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Oct. 12, 2017
Applicant:

Walmart Apollo, Llc, Bentonville, AR (US);

Inventors:

Bruce W. Wilkinson, Rogers, AR (US);

David Winkle, Bella Vista, AR (US);

Matthew Allen Jones, Bentonville, AR (US);

Aaron James Vasgaard, Fayetteville, AR (US);

Nicholaus Adam Jones, Fayetteville, AR (US);

Robert James Taylor, Rogers, AR (US);

Todd Davenport Mattingly, Bentonville, AR (US);

Assignee:

Walmart Apollo, LLC, Bentonville, AR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/04 (2006.01); G01D 21/02 (2006.01); G01D 11/00 (2006.01); G01M 3/00 (2006.01); G01N 33/02 (2006.01);
U.S. Cl.
CPC ...
G01N 27/048 (2013.01); G01D 11/00 (2013.01); G01D 21/02 (2013.01); G01M 3/00 (2013.01); G01N 33/025 (2013.01);
Abstract

A technique for monitoring the quality of objects is disclosed. A container includes a multiple sensors and is configured to receive an object. The sensors monitor various metrics associated with the quality of the object, and a display is affixed to the container for displaying a visual indication of the quality of the object. The visual indication is based on data collected from the sensors. A quality monitoring module is executed by a processor to control the sensors to switch operation between a first mode of operation and a second mode of operation based on a detected change in one of the metrics monitored by the sensors.


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