The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Nov. 09, 2017
3m Innovative Properties Company, St. Paul, MN (US);
Tasuku Nakayama, Ninomiya, JP;
Kazuma Nuno, Sagamihara, JP;
3M INNOVATIVE PROPERTIES COMPANY, St. Paul, MN (US);
Abstract
To suitably determine a measurement cycle at which to measure cracks that occur in structures formed from concrete or the like. Resolution Means: A measurement cycle determination device () includes a related information acquisition unit () that acquires at least one of geographic information including items related to a geography of a site where a structure is located, weather information including items related to weather at the site, and structure information including items related to the structure; a crack information acquisition unit () that acquires crack information related to a crack that has occurred in the structure; a measurement cycle determination unit () that determines, on the basis of at least one of the geographic information, the weather information, the structure information, and the crack information, a measurement cycle at which to measure a width of the crack; and a measurement cycle output unit () that outputs a measurement cycle signal indicating measurement cycle information related to the determined measurement cycle.