The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Oct. 07, 2019
Olympus Corporation, Tokyo, JP;
Nobuyuki Hirai, Hino, JP;
Eiji Yasuda, Hachioji, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A method of estimating an optical physical property value distribution includes: first estimating including reading a first measured value obtained by measuring isotropic backscattering light of light that is applied to a measurement subject, from a storage and estimating a first optical physical property value distribution that is an optical physical property value distribution in the measurement subject, by an inverse analysis arithmetic operation; and second estimating including reading a second measured value obtained by measuring more anisotropic backscattering light of light that is applied to the measurement subject than the backscattering light corresponding to the first measured value, from a storage and estimating a second optical physical property value distribution that is an optical physical property value distribution in the measurement subject, by an inverse analysis arithmetic operation using at least part of the first optical physical property value distribution as an initial value.