The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Jul. 21, 2017
National University Corporation Nara Institute of Science and Technology, Nara, JP;
Takahito Aoto, Nara, JP;
Yasuhiro Mukaigawa, Nara, JP;
Abstract
To provide a method whereby viscoelasticity of an object can be measured nondestructively and in non-contact fashion in a short time. By this method, elastic waves and light are radiated to an object and the viscoelasticity of an object is measured nondestructively and in non-contact fashion using a shadow change based on a change in the direction of a line normal to the surface of the object. Specifically, the present invention has an elastic wave transmission step for pressurizing or exciting the object by elastic waves and causing a minute displacement of the object surface shape, a photoirradiation step for radiating light to the minutely displaced object surface, an image acquisition step for acquiring a shadow change based on a change in the direction of a line normal to the object surface, and a viscoelasticity estimation step for processing an image of the acquired shadow change and calculating a viscoelasticity.