The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Jan. 20, 2020
Pixart Imaging Inc., Hsin-Chu, TW;
Yu-Han Chen, Hsin-Chu, TW;
Chih-Wei Huang, Hsin-Chu, TW;
Chi-Chieh Liao, Hsin-Chu, TW;
Wei-Chung Wang, Hsin-Chu, TW;
Pix Art Imaging Inc., Hsin-Chu, TW;
Abstract
A pressure measuring method, applied to a pressure measuring apparatus, comprising: measuring a first pressure sensing value when the pressure measuring apparatus operates at a first scan frequency and receives a first pressure; and measuring a second pressure sensing value when the pressure measuring apparatus operates a second scan frequency and receives the first pressure. The first pressure sensing value and the second pressure sensing value are different, and a change between the first pressure sensing value and the second pressure sensing value is according to a change between the first scan frequency and the second scan frequency. The first scan frequency and the second scan frequency are different. The pressure measuring method can further comprise a calibrating mechanism to compensate the sensed pressure. By this way, the pressure sensing value can be calibrated, to solve the issue that the pressure sensing values are affected by scan frequencies.