The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Jun. 20, 2017
Applicant:
Canon U.s.a. Inc., Melville, NY (US);
Inventors:
Mark Alan Hamm, Lynnfield, MA (US);
Bin Wu, West Roxbury, MA (US);
Albert Dunfee, Newbury, MA (US);
Badr Elmaanaoui, Belmont, MA (US);
Assignee:
Canon U.S.A., Inc., Melville, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/12 (2006.01); A61B 8/00 (2006.01); G01S 7/52 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
A61B 8/4254 (2013.01); A61B 8/12 (2013.01); A61B 8/445 (2013.01); G01S 7/5205 (2013.01); G01S 15/894 (2013.01); A61B 8/4461 (2013.01);
Abstract
Exemplary probes including longitudinal marker elements arranged parallel to the probe axis are provided for reducing or eliminating non-uniform rotational distortions (NURD) in imaging systems. Additional ring marker elements may also be provided to reduce or eliminate non-uniform linear distortion (NULD). These probes, as well as systems and methods of use provide for images having better image quality and reduced NURD.