The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2021

Filed:

Feb. 26, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Kihong Son, Suwon-si, KR;

Kyoung-Yong Lee, Suwon-si, KR;

Duhgoon Lee, Suwon-si, KR;

Wooyoung Jang, Suwon-si, KR;

Jaemoon Jo, Suwon-si, KR;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2006.01); G06T 11/00 (2006.01); G06T 7/246 (2017.01);
U.S. Cl.
CPC ...
A61B 6/5264 (2013.01); A61B 6/032 (2013.01); A61B 6/4452 (2013.01); A61B 6/461 (2013.01); A61B 6/463 (2013.01); G06T 7/246 (2017.01); G06T 11/008 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20081 (2013.01); G06T 2211/412 (2013.01);
Abstract

A method and apparatus correct a computed tomography (CT) image with motion artifacts. The method of correcting a CT image may include: obtaining a reconstruction image of an object by reconstructing an X-ray projection image; measuring a parameter value related to motion artifacts that occur due to movement of the object in at least one of the X-ray projection image or the reconstruction image; calculating a correction possibility for the reconstruction image based on the measured parameter value; and determining whether to perform correction on the reconstruction image based on the calculated correction possibility.


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