The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2021
Filed:
Oct. 10, 2018
Optical measurement system and method including blink rate monitor and/or tear film breakup detector
Amo Development, Llc, Santa Ana, CA (US);
Richard J. Copland, Albuquerque, NM (US);
John G. Dixson, Albuquerque, NM (US);
AMO Development, LLC, Santa Ana, CA (US);
Abstract
An optical measurement system and method measure a characteristic of a subject's eye. The optical measurement system receives from an operator, via a user interface of the optical measurement instrument, a begin measurement instruction indicating the start of a measurement period for objectively measuring at least one characteristic of the subject's eye. Subsequent to receiving the begin measurement instruction, the optical measurement system determines whether a criterion associated with the tear film quality of the subject's eye is not satisfied. In response to determining that the criterion is not satisfied, the optical measurement instrument takes one or more corrective actions to measure the characteristic of the subject's eye under a condition wherein the criterion is satisfied.