The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Nov. 19, 2019
Applicant:

Cirba Ip Inc., Markham, CA;

Inventors:

Andrew D. Hillier, Toronto, CA;

Tom Yuyitung, Toronto, CA;

Assignee:

Cirba IP Inc., Markham, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 41/022 (2013.01); H04L 41/0853 (2013.01); H04L 41/0873 (2013.01);
Abstract

Compatibility and consolidation analyses can be performed on a collection of systems to evaluate the 1-to-1 compatibility of every source-target pair, evaluate the multi-dimensional compatibility of specific transfer sets, and to determine the best consolidation solution based on various constraints including the compatibility scores of the transfer sets. The analyses can be done together or be performed independently. These analyses are based on collected system data related to their technical configuration, business factors and workloads. Differential rule sets and workload compatibility algorithms are used to evaluate the compatibility of systems. The technical configuration, business and workload related compatibility results are combined to create an overall compatibility assessment. These results are visually represented using color coded scorecard maps.


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