The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Aug. 10, 2018
Applicant:

National Instruments Corporation, Austin, TX (US);

Inventors:

Nikhil U. Kundargi, Austin, TX (US);

Achim Nahler, Dresden, DE;

James Wesley McCoy, Leander, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04W 16/28 (2009.01); H04B 7/0413 (2017.01); H04B 7/08 (2006.01); H04B 17/382 (2015.01); H04B 7/06 (2006.01); H04W 24/10 (2009.01); H04B 17/318 (2015.01); H04B 17/21 (2015.01); H04B 17/24 (2015.01); H04L 12/26 (2006.01); H04W 72/08 (2009.01); H04W 72/04 (2009.01); H04B 17/10 (2015.01); H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04B 7/0814 (2013.01); H04B 7/0413 (2013.01); H04B 7/063 (2013.01); H04B 7/0626 (2013.01); H04B 7/0695 (2013.01); H04B 17/21 (2015.01); H04B 17/24 (2015.01); H04B 17/318 (2015.01); H04B 17/382 (2015.01); H04L 43/16 (2013.01); H04W 16/28 (2013.01); H04W 24/10 (2013.01); H04W 72/085 (2013.01); H04B 7/0628 (2013.01); H04B 17/101 (2015.01); H04L 5/006 (2013.01); H04L 5/0023 (2013.01); H04L 5/0053 (2013.01); H04W 72/0413 (2013.01);
Abstract

A base station (BS)/user equipment (UE) for performing radio frequency beam management and recovery in communication with a UE/BS. The BS/UE includes a processor and a memory that stores first and second thresholds. The processor evaluates a beam quality metric against the first and second thresholds, performs beam switching and/or beam broadening in response to determining the beam quality metric falls below the first threshold, and performs a beam failure recovery procedure in response to determining the beam quality metric falls below the second threshold.


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