The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Jan. 18, 2016
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yuki Chiba, Tokyo, JP;

Yousuke Motohashi, Tokyo, JP;

Ryohei Fujimaki, Sunnyvale, CA (US);

Satoshi Morinaga, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/02 (2006.01); G06N 20/00 (2019.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G06N 5/022 (2013.01); G06N 5/045 (2013.01); G06N 20/00 (2019.01);
Abstract

An apparatus that extracts an explanatory variable used as a condition from a classification model classified by the condition for selecting a component used for prediction, displays the explanatory variable in association with any of dimensional axes of a multi-dimensional space in which a prediction value is displayed, specifies the component that corresponds to a position in the multi-dimensional space specified by each of the explanatory variables associated with the dimensional axis, displays the prediction value calculated based on the specified component, on the same position and displays the multi-dimensional space that corresponds to the position in which the prediction value is displayed, in a mode that corresponds to the component used for calculating the prediction value.


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