The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Dec. 30, 2019
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Michael A. Guillorn, Cold Springs, NY (US);
Kafai Lai, Poughkeepsie, NY (US);
Chi-Chun Liu, Altamont, NY (US);
Ananthan Raghunathan, Wappingers Falls, NY (US);
Hsinyu Tsai, White Plains, NY (US);
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 30/39 (2020.01); H01L 29/66 (2006.01); G06F 119/18 (2020.01);
U.S. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 30/39 (2020.01); G06F 2119/18 (2020.01); H01L 29/66795 (2013.01); Y02P 90/02 (2015.11);
Abstract
A method for reducing chemo-epitaxy directed-self assembly (DSA) defects of a layout of a guiding pattern, the method comprising expanding a shape of the guiding pattern by a predetermined distance in both lateral directions to form a fin keep mask, where the fin keep mask comprises a stand-alone mask.