The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Jun. 18, 2018
Yandex Europe Ag, Lucerne, CH;
Valeriya Dmitrievna Tsoy, Novosibirsk, RU;
Roman Yakovlevich Budylin, Moscow, RU;
Aleksey Valerievich Drutsa, Moscow, RU;
Ilya Vladimirovich Katsev, Saint-Petersburg, RU;
YANDEX EUROPE AG, Lucerne, CH;
Abstract
A method and server for generating values of an overall evaluation criterion (OEC) to be used during a control/treatment testing is provided. The method comprises, for each of the control and treatment versions: receiving datasets indicative of user interactions; determining first sets of values of a first per-user metric; and determining second sets of values of a second per-user metric. The method comprises selecting a linearization value. The method comprises, for each one of the control and treatment versions, determining linearized sets of values where values in a given linearized set are differences between (i) values of the first set from (ii) values of the second set that are weighted by the linearization value; and generating OEC values based on the linearized sets. Difference between OEC values is indicative of a magnitude and direction of the change in interactions between the versions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile