The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Oct. 09, 2019
Visa International Service Association, San Francisco, CA (US);
Ila Malde, Foster City, CA (US);
Ze Hong Sean Tay, Singapore, SG;
Karthik Venkatarman, Singapore, SG;
Vara Prasad Beerakam, Singapore, SG;
VISA INTERNATIONAL SERVICE ASSOCIATION, San Francisco, CA (US);
Abstract
An automated method for monitoring a lifecycle of code development includes first receiving a submission from a developer for tracking a maturity of an application program as it goes through a software development life cycle pipeline and for deployment into a production environment. A database is constructed with data fields associated with the application program. The code coverage of the application program is determined, as well as a test coverage value. A plurality of reliability parameters are assigned, along with a plurality of security parameters associated with the application program. A maturity score is calculated as a function of the plurality of the reliability parameters, the plurality of security parameters, the development status, the code coverage value, and the test coverage value. A graphical user interface (GUI) is provided to a user for analysis and modification.