The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Feb. 13, 2018
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Sandeep Krishnamurthy, Santa Clara, CA (US);

Jiajie Chen, San Bruno, CA (US);

Jonathan Esterhazy, Alameda, CA (US);

Naveen Mysore Nagendra Swamy, Campbell, CA (US);

Ruofei Yu, Los Altos, CA (US);

Yao Wang, Sunnyvale, CA (US);

Roshani Nagmote, San Mateo, CA (US);

Hagay Lupesko, San Mateo, CA (US);

Vikram Madan, San Francisco, CA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/48 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 9/4881 (2013.01); G06N 20/00 (2019.01);
Abstract

Techniques for benchmarking a machine learning model/algorithm are described. For example, in some instances a method includes generating an execution plan for benchmarking of at least one task corresponding to a machine learning model based on an identified machine learning model, identified training data, and at least one objective for the benchmarking job; receiving execution statistics about the execution of the task as a part of the benchmarking job according to the execution plan; and updating the execution plan based at least in part on the received execution statistics of the task.


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