The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2021

Filed:

Nov. 05, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Xiaobo Wang, Beijing, CN;

Shuo Li, Beijing, CN;

Shengyan Sun, Beijing, CN;

Xiao Xiao Chen, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 8/656 (2018.01); G06F 16/21 (2019.01);
U.S. Cl.
CPC ...
G06F 8/656 (2018.02); G06F 16/213 (2019.01); G06F 16/217 (2019.01);
Abstract

A method, system and computer program for analysis of patch impact. The method comprises obtaining first data manipulating statement (DMS) from description of a patch to be installed to a database system; extracting first parse tree and first access path of first DMS; obtaining second DMS from an running database application; extracting second parse tree of second DMS; comparing first parse tree with second parse tree and first access path with second access path; and installing the patch to a database system in response to a determination that first parse tree is a subset of second parse tree and first access path is a subset of second access path.


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