Data shaping to reduce error rates in solid state memory devices

Abstract

Systems and methods are described for reducing error rates on data storage devices by applying data shaping to data written to such devices in order to avoid error-prone states on cells within the devices. Different states of individual cells (such as those representing different bit patterns) may have different propensities for error, and these propensities may vary during operation of a device. Thus, a device as disclosed herein may determine error-prone states for a cell or group of cells, and apply data shaping to data written to such cells to reduce the likelihood that writing the data places the cell or cells into an error-prone state. Data shaping may be used, for example, to increase the occurrence of '0' bits within input data, thus avoiding error-prone low voltage states that may be used to represent a series of '1' bits.