The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
Mar. 13, 2020
Hitachi, Ltd., Tokyo, JP;
Hiroyuki Yoshimoto, Tokyo, JP;
Naoko Ushio, Tokyo, JP;
Ryohei Matsui, Tokyo, JP;
Hiroki Ohashi, Tokyo, JP;
Toshinari Ishii, Tokyo, JP;
Daiji Iwasa, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
The product inspection system comprises an inspection information collecting unit which collects inspection information acquired from an inspection target, an inspection time acquisition unit which acquires an inspection time that the inspection information was acquired, a recording unit which mutually associates and records the inspection information collected by the inspection information collecting unit and the inspection time acquired by the inspection time acquisition unit, and a display control unit which displays the inspection information recorded in the recording unit on a display terminal.